Research on the Environmental Adaptability Test Method of Integrated Circuit Electrical Parameters Based on LK8820 Platform

In this paper, the CD4511 chip is selected as the focus of this research to build the LK8820 platform, which mainly consists of the power supply, interface and reference voltage board (IV), power supply and measurement board (PM), digital function pin board (PE), and analog function board (WM). The input and output pins of the CD4511 IC chip are connected to the PIN pins on the PE board of the LK8820 test platform for testing, and the test functions are written in the C language environment. After the test program is written, the LK8820 test platform is used to test the CD4511 integrated circuit chip for the environmental adaptability of electrical parameters. The use of highly integrated chip CD4511 makes the small range of measurement accuracy is very high, but the large current range error is relatively large, due to the external large current range using precision resistors with an accuracy of 0.5% in parallel, after calibration, the error is controlled within the allowable range. 6 input pins of the input high level test results and the input low level test results are in the range of RMS, the number of anomalies is 0, which meets the IC electrical parameters environmental adaptability test. The test results of input high level and input low level of 6 input pins are all within the RMS value range, and the number of abnormalities is 0, which meets the requirement of environmental adaptability test of integrated circuits.