Irregular-spotty-byte error control codes were devised by the author in [2] and their properties were further studied in [3] and [4]. These codes are suitable for semi-conductor memories where an I/O word is divided into irregular bytes not necessarily of the same length. The \(i\)-spotty-byte errors are defined as \(t_i\) or fewer bit errors in an \(i\)-byte of length \(n_i\), where \(1 \leq t_i \leq n_i\) and \(1 \leq i \leq s\). However, an important and practical situation is when \(i\)-spotty-byte errors caused by the hit of high energetic particles are confined to \(i\)-bytes of the same size only which are aligned together or in words errors occur usually in adjacent RAM chips at a particular time. Keeping this view, in this paper, we propose a new model of \(i\)-spotty-byte errors, viz. uniform \(i\)-spotty-byte errors and present a new class of codes, viz. uniform \(i\)-spotty-byte error control codes which are capable of correcting all uniform \(i\)-spotty-byte errors of \(i\)-spotty measure \( \mu \) (or less). The study made in this paper will be helpful in designing modified semi-conductor memories consisting of irregular RAM chips with those of equal length aligned together.